Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial
Semiconductor Devices
Abstract
This work proposes a “dynamic biasing” technique and uses on-orbit
simulations with experimental testing to demonstrate up to a 16x
improvement in total-dose lifetimes for COTS devices without additional
shielding or modifications to the chip. Building upon this foundation,
the dynamic biasing technique offers a unique opportunity for
microelectronic systems to begin intelligently responding in real-time
to their radiation environment. We believe this fundamental technique
can become an integral tool to countless future electronic systems in
space.