TechRxiv
Dynamic_Biasing_MHolliday.pdf (5.4 MB)

Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Semiconductor Devices

Download (5.4 MB)
preprint
posted on 05.04.2021, 15:33 by Maximillian Holliday, Thomas Heuser, Zachary Manchester, Debbie Senesky
This work proposes a "dynamic biasing" technique and uses on-orbit simulations with experimental testing to demonstrate up to a 16x improvement in total-dose lifetimes for COTS devices without additional shielding or modifications to the chip. Building upon this foundation, the dynamic biasing technique offers a unique opportunity for microelectronic systems to begin intelligently responding in real-time to their radiation environment. We believe this fundamental technique can become an integral tool to countless future electronic systems in space.

History

Email Address of Submitting Author

maholli@stanford.edu

ORCID of Submitting Author

0000-0002-9382-3916

Submitting Author's Institution

Stanford University

Submitting Author's Country

United States of America

Exports

Exports