Dynamic_Biasing_MHolliday.pdf (5.4 MB)

Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Semiconductor Devices

Download (5.4 MB)
posted on 05.04.2021, 15:33 by Maximillian HollidayMaximillian Holliday, Thomas Heuser, Zachary Manchester, Debbie Senesky
This work proposes a "dynamic biasing" technique and uses on-orbit simulations with experimental testing to demonstrate up to a 16x improvement in total-dose lifetimes for COTS devices without additional shielding or modifications to the chip. Building upon this foundation, the dynamic biasing technique offers a unique opportunity for microelectronic systems to begin intelligently responding in real-time to their radiation environment. We believe this fundamental technique can become an integral tool to countless future electronic systems in space.


Email Address of Submitting Author

ORCID of Submitting Author


Submitting Author's Institution

Stanford University

Submitting Author's Country

United States of America

Usage metrics