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Physical Basis of Lognormals in Reliability for Microelectronics With Deposited Metal Layers

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posted on 2022-03-03, 20:02 authored by genghmun enggenghmun eng
Lognormal Probability Density Functions (pdfs) are often empirically found to fit the distribution of failure lifetimes for electronic components, but prior to this work, a physical basis has not be found for why Lognormals should be applicable. Using long-thin metal interconnects atop non-conducting substrates as a representative system, we show Lognormals pdfs for device lifetimes naturally arise, whenever there is a standard Gaussian variation in device geometry, with the case studied being variations in metal interconnect line-widths.




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Aerospace Corp.

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  • United States of America