Reliability Model for DR FLASH Memories2rows ver2.docx (5 MB)
Reliability Model For Data Retention In FLASH Memories
New reliability model for prediction of data retention in Flash memories, that taking into account cell type, workin temerature, endurance, tunnel width all togther.
The model is accurate, simple and easy to use.
The model is accurate, simple and easy to use.
History
Email Address of Submitting Author
zacicohen@gmail.comORCID of Submitting Author
ZCSubmitting Author's Institution
TechnionSubmitting Author's Country
- Israel