TechRxiv

Jinfeng Li

0000-0001-9462-2625

Research Fellow (Components, Circuits, Devices and Systems; Communication, Networking and Broadcast Technologies; Engineered Materials, Dielectrics and Plasmas; Fields, Waves and Electromagnetics; Nuclear Engineering; Power, Energy and Industry Applications)

London, UK

Dr. Jinfeng Li is a microwave engineer, a specialist in novel reconfigurable RF devices, as well as an authority on liquid crystals-based microwave and millimetre-wave technology. He received the Ph.D. degree in liquid crystals-based microwave and millimeter-wave electronics engineering from University of Cambridge. Dr Li was a recipient of the IET Award, the AP Jarvis Prize, and two Best Paper Awards at the IEEE and IOP conferences, respectively. He was a Cambridge Trust Scholar, Speaker at the 50th & 46th European Microwave Conferences, Emerging Technologist with Barclays UK, Editorial Board member of 3 Science Citation Index journals, TPC and Session Chair of 3 IEEE conferences, including IEEE ISAP (27th International Symposium on Antennas and Propagation), Top 1% Reviewer on Publons (Web of Science), and Newton Prize fund reviewer for the UK National Commission for UNESCO.

Publications

  • https://doi.org/10.3390/cryst9120650
  • https://doi.org/10.1364/OE.26.010162
  • https://ieeexplore.ieee.org/document/7824526
  • https://doi.org/10.3390/cryst12050632
  • http://www.engineeringletters.com/issues_v28/issue_3/EL_28_3_03.pdf
  • https://doi.org/10.7567/JJAP.56.011701
  • https://doi.org/10.33166/aetic.2020.03.001
  • https://doi.org/10.1117/12.2570001
  • https://doi.org/10.1117/12.2593624
  • https://ieeexplore.ieee.org/document/9337967
  • https://ieeexplore.ieee.org/document/9816384
  • https://ieeexplore.ieee.org/document/9331345
  • https://ieeexplore.ieee.org/document/9331555
  • https://ieeexplore.ieee.org/document/9567615
  • https://ieeexplore.ieee.org/document/9199680
  • https://iopscience.iop.org/article/10.1088/1757-899X/892/1/012057
  • https://doi.org/10.33166/AETiC.2021.04.002
  • https://doi.org/10.33166/AETiC.2022.03.001
  • https://ieeexplore.ieee.org/document/9202604
  • https://ieeexplore.ieee.org/document/7821401
  • https://ieeexplore.ieee.org/document/8931720
  • https://ieeexplore.ieee.org/document/9330818
  • https://ieeexplore.ieee.org/document/9244313
  • https://doi.org/10.1007/978-3-030-60036-5_7
  • https://doi.org/10.48550/arXiv.2005.03599

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