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Multi-path Coverage of all Final States for Model-Based Testing Theory using Spark In-memory Design
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  • Wilfried Yves Hamilton Adoni ,
  • Moez Krichen ,
  • Tarik Nahhal ,
  • Abdeltif Elbyed
Wilfried Yves Hamilton Adoni
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Moez Krichen
Al-baha University

Corresponding Author:[email protected]

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Tarik Nahhal
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Abdeltif Elbyed
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This paper deals with an efficient and robust distributed framework for finite state machine coverage in the field model based testing theory. All final states coverage in large-scale automaton is inherently computing-intensive and memory exhausting with impractical time complexity because of an explosion of the number of states. Thus, it is important to propose a faster solution that reduces the time complexity by exploiting big data concept based on Spark RDD computation. To cope with this situation, we propose a parallel and distributed approach based on Spark in-memory design which exploits A* algorithm for optimal coverage. The experiments performed on multi-node cluster prove that the proposed framework achieves significant gain of the computation time.