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Dynamic Biasing for Improved On-Orbit Total-Dose Lifetimes of Commercial Semiconductor Devices
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  • Maximillian Holliday ,
  • Thomas Heuser ,
  • Zachary Manchester ,
  • Debbie Senesky
Maximillian Holliday
Stanford University, Stanford University

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Thomas Heuser
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Zachary Manchester
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Debbie Senesky
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This work proposes a “dynamic biasing” technique and uses on-orbit simulations with experimental testing to demonstrate up to a 16x improvement in total-dose lifetimes for COTS devices without additional shielding or modifications to the chip. Building upon this foundation, the dynamic biasing technique offers a unique opportunity for microelectronic systems to begin intelligently responding in real-time to their radiation environment. We believe this fundamental technique can become an integral tool to countless future electronic systems in space.
Aug 2022Published in IEEE Transactions on Aerospace and Electronic Systems volume 58 issue 4 on pages 3326-3336. 10.1109/TAES.2022.3148974