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Reference-Plane Invariant Free Space Dielectric Material Characterization up to 330 GHz
  • +5
  • Salvador Moreno-Rodríguez,
  • Mario Pérez-Escribano,
  • Sergio Ortiz-Ruiz,
  • Borja Plaza-Gallardo,
  • Francisco G Ruiz,
  • Carlos Molero,
  • Carlos Molero,
  • antonio alex amor
Salvador Moreno-Rodríguez
Department of Signal Theory, Research Centre for Information and Communication Technologies (CITIC-UGR), Telematics and Communications, University of Granada
Mario Pérez-Escribano
Telecommunication Research Institute (TELMA), Universidad de Málaga, E.T.S. Ingeniería de Telecomunicación
Sergio Ortiz-Ruiz
Department of Electronics and Computer Science, ) Pervasive Electronics Advanced Research Laboratory (PEARL), University of Granada
Borja Plaza-Gallardo
) Radiofrequency Area, National Institute for Aerospace Technology (INTA)
Francisco G Ruiz
Department of Electronics and Computer Science, ) Pervasive Electronics Advanced Research Laboratory (PEARL), University of Granada
Carlos Molero
Department of Signal Theory, Research Centre for Information and Communication Technologies (CITIC-UGR), Telematics and Communications, University of Granada

Corresponding Author:[email protected]

Author Profile
Carlos Molero
Department of Signal Theory, Research Centre for Information and Communication Technologies (CITIC-UGR), Telematics and Communications, University of Granada
antonio alex amor
Department of Electrical and Systems Engineering, University of Pennsylvania

Abstract

This paper describes the process followed to implement a system to characterize the complex permittivity of materials in the 10-330 GHz frequency band. Firstly, the method used and the system's calibration process are shown, consisting of a double calibration TRL (Thru-Reflect-Line) and GRL (Gated-Reflect-Line). Subsequently, a smoothing technique is used to improve the accuracy of the results. Finally, a test is performed on quartz and glass fiber samples, showing that the results are quite reliable over the entire measured bandwidth.
24 Jan 2024Submitted to TechRxiv
26 Jan 2024Published in TechRxiv