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Modeling the multiple reflections of radiation between terrains and analyzing the reflection characteristics of a lunar area with low topographic undulation
  • Yunfei Liu
Yunfei Liu
Shanghai Institute of technical physics, Shanghai Institute of technical physics

Corresponding Author:[email protected]

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Abstract

Based on the adjacent terrain irradiance formula of the first-order reflection proposed by Proy, the second-order to the nth-order reflections of radiation between terrains are derived in this paper, and incident radiation received by the terrain surface is quantified. It is concluded that the observation reflectance of low-spatial-resolution remote sensing pixels is a function of the real reflectance of the microtopography within the pixel, terrain roughness, solar incidence angle, and remote sensing observation angle. at the observation reflectance of low-spatial-resolution remote sensing pixels is a function of the real reflectance of the microtopography within the pixel, terrain roughness, solar incidence angle, and remote sensing observation angle.
2022Published in IEEE Transactions on Geoscience and Remote Sensing volume 60 on pages 1-17. 10.1109/TGRS.2022.3225645