Abstract
An IPM monitor to measure a detailed profile of the beam has been
developed and constructed. The monitor was developed in the course of
modernization of the structure operating on the basis of electric field
scanning. The monitor also consists of an extractor, a scanner and two
electrostatic analyzers in series. A system to control the monitor and
process the data has been developed and produced. As a result of
performance testing of the monitor it is established that it allows
detailed measurements of the profiles of wide beams with a resolution of
1.5х1.5 mm2. It is found that the monitor minimum
sensitivity is n‧103 particle/cm2‧s
for the 132Хе26+ ion beam with the
energy 1.2 MeV/nucleon and the pressure 5 10-4 Pa of
permanent gas in the diagnostic unit. The monitor fits for control of
both creation of a uniform distribution of the beam profile and
continuous observation of uniformity variations during exposition. The
detail profile monitors have been developed for the 45 mm diameter beam
for a setup to conduct studies in the field of radiobiology and for the
60mm diameter beam for investigation of radiation effects of
radioelectronic equipment.