Abstract
In this paper, we present a novel digital-like defect-oriented Built-In
Self-Test (BIST) methodology for Analog and Mixed-Signal (AMS) circuits.
The core idea of this approach centers around the segmentation of
complex AMS circuits into smaller, more manageable units for analysis.
Emphasizing resource utilization efficiency, we highlight the necessity
of employing purely digital circuits for both injectors and monitors
within the BIST framework. We demonstrate the effectiveness of this
approach through the development of a BIST system for a 12-bit
Successive Approximation Register Analog-to-Digital Converter (SAR ADC).
Notably, our methodology achieves 100% defect coverage without
introducing additional BIST circuitry for subcircuit testing, relying
solely on digital monitors for sampling switch evaluation. Furthermore,
our proposed approach incurs minimal area overhead, resulting in a fast
and comprehensive defect-oriented BIST solution. This versatile test
method can be deployed post-manufacturing or in-field, offering
flexibility in its application timing.