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Time-Domain Characterization of Nematic Liquid Crystals Using Additive Manufacturing Microstrip Lines
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  • Pablo Mateos-Ruiz,
  • Mario Pérez-Escribano,
  • Alberto Hernández-Escobar,
  • Elena Abdo-Sánchez,
  • Enrique Márquez-Segura,
  • Teresa María Martín-Guerrero,
  • Carlos Camacho-Peñalosa
Pablo Mateos-Ruiz
Universidad de Málaga

Corresponding Author:[email protected]

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Mario Pérez-Escribano
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Alberto Hernández-Escobar
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Elena Abdo-Sánchez
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Enrique Márquez-Segura
Teresa María Martín-Guerrero
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Carlos Camacho-Peñalosa
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Abstract

This paper presents a method for effectively characterizing the dielectric permittivity of nematic liquid crystals across a broad frequency range. These materials show significant potential for reconfigurable devices operating in microwave and millimeter-wave frequencies. To achieve this goal, an additive manufacturing technique is used to create a microstrip line that can be filled with liquid that acts as its substrate. The liquid crystal (LC) is then biased to modulate its permittivity. After manufacturing, a time-gating approach is used to extract the permittivity, eliminating the need for in-fixture calibration, such as Thru-Reflect-Line (TRL). Finally, the approach is validated through simulations and experimental results, which closely align with those reported using other methods in the bibliography.
29 May 2024Submitted to TechRxiv
04 Jun 2024Published in TechRxiv