An analytical method for estimation of parameters of Self Mixing
Interferometric phase equation over all feedback regimes
Abstract
This paper presents a novel algorithm for measuring the linewidth
enhancement factor of semiconductor lasers and the optical feedback
level factor in a semiconductor laser with an external cavity. The
proposed approach is based on analysis of the self-mixing phase equation
to deduce equations for finding parameters given only knowledge of the
perturbed phase. The effectiveness of the method has been validated with
accuracy of 8.6%and 1.7% for āCā and alpha respectively while covering
all feedback regimes.